Radial Symmetry Center Original Paper
Sub-pixel center positioning of approximately radially symmetric targets
Verification date: 2026-10-24
View original public information →Facing the laser microscope illumination head, taking the light spot position on the target surface as the observation route, the center difference before and after the objective lens is switched is intended to be output. The page is for project evaluation and does not mean that the development has been completed or has been accepted on site.
Fix the camera and target surface, record the exposure and gain, and cover the light spot and background in the field of view. Microscopes, relay sampling and wavelength-adapted cameras
Fix the camera and target surface, record exposure and gain, and cover the light spot and background in the field of view
Existing algorithmic evidence:A101–A112 only complete analytical synthesis spot and controlled geometry verification; see laser_spot_benchmark.json
Existing light point positioning, quality diagnosis or statistical modules can be used as the main calculation basis; ROI, calibration, threshold and interface verification still need to be completed by device.
Gaps in this scenario:ROI, ruler/plane calibration and reference point definition are required; only the two-dimensional position of the target surface can be directly observed. The relationship between objective lens chromatic aberration and back focal plane needs to be verified. Particle image positioning is an algorithm migration and the image model must be re-verified.
Route-level gaps:Requires ROI, ruler/plane calibration and reference point definition; can only directly observe the two-dimensional position of the target surface
"Reusable modules" only describe the relative development volume and do not constitute a commitment to accuracy, tempo, stability or delivery time.
Test independently with a two-dimensional displacement stage and a fixed reference point, reporting center error P95, missed detections and false detections. Microsphere stage, microscopic ruler and independent positioning reference
| Acceptance items | Evidence required for project confirmation | Current status |
|---|---|---|
| Inputs and samples | Real device original frames, normal/abnormal samples, exposure and light path conditions, sample grouping and set aside | Not provided, waiting for project input |
| Magnitude and Error | Independent reference value, calibration record, error statistical caliber and mutual confirmation threshold | Not verified |
| Exceptions and boundaries | Anticipated handling of missed detections, false detections, overexposure, occlusion, reflection, out-of-view and communication abnormalities | To be defined |
| System integration | Interface, time synchronization, deployment platform, tempo, log, version and continuous running record | Not integrated |
The source supports measurement principles or similar applications; the module combination, device and acceptance method in this scenario are engineering derivation, and product verification has not been completed.
Sub-pixel center positioning of approximately radially symmetric targets
Verification date: 2026-10-24
View original public information →Limited particle position detection and the impact of exposure and sampling on calibration
Verification date: 2026-10-24
View original public information →Optical conditions in small beam near-field, far-field and mode field measurements
Verification date: 2026-10-24
View original public information →Beam point return verification after changing objective lens
Please describe the task object, original picture or video, target indicators, device platform, interface and sample situation.
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