Radial Symmetry Center Original Paper
Sub-pixel center positioning of approximately radially symmetric targets
Verification date: 2026-10-24
View original public information →Facing the microlaser processing platform, the two-dimensional command/target surface coordinate calibration is used as the observation route, and the residual error of the microscopic XY coordinate is planned to be output. The page is for project evaluation and does not mean that the development has been completed or has been accepted on site.
Cover the calibrated corresponding points and independent set-out points of the two-dimensional field of view, and fix the optical path and working plane. Microscopes, relay sampling and wavelength-adapted cameras
Calibration corresponding points and independent set-out points covering the two-dimensional field of view, fixed optical path and working plane
Existing algorithmic evidence:A101–A112 only complete analytical synthesis spot and controlled geometry verification; see laser_spot_benchmark.json
The light point detection front-end or timing statistics module can be reused, but the project still needs to add geometric calibration, time synchronization, motion compensation or equipment system integration.
Gaps in this scenario:Calibration acquisition, coordinate definition and verification are required; two-dimensional empirical mapping does not represent any three-dimensional or robot calibration. The objective lens magnification and cover glass need to be fixed. Particle image positioning is an algorithm migration and the image model must be re-verified.
Route-level gaps:Calibration acquisition, coordinate definition and verification are required; two-dimensional empirical mapping does not represent any three-dimensional or robot calibration
"Partially reusable" only describes the relative development volume and does not constitute a commitment to accuracy, tempo, stability or delivery time.
Separate calibration points and set-out points to check edge, back-and-forth, temperature and repeated clamping errors. Microsphere stage, microscopic ruler and independent positioning reference
| Acceptance items | Evidence required for project confirmation | Current status |
|---|---|---|
| Inputs and samples | Real device original frames, normal/abnormal samples, exposure and light path conditions, sample grouping and set aside | Not provided, waiting for project input |
| Magnitude and Error | Independent reference value, calibration record, error statistical caliber and mutual confirmation threshold | Not verified |
| Exceptions and boundaries | Anticipated handling of missed detections, false detections, overexposure, occlusion, reflection, out-of-view and communication abnormalities | To be defined |
| System integration | Interface, time synchronization, deployment platform, tempo, log, version and continuous running record | Not integrated |
The source supports measurement principles or similar applications; the module combination, device and acceptance method in this scenario are engineering derivation, and product verification has not been completed.
Sub-pixel center positioning of approximately radially symmetric targets
Verification date: 2026-10-24
View original public information →Limited particle position detection and the impact of exposure and sampling on calibration
Verification date: 2026-10-24
View original public information →Optical conditions in small beam near-field, far-field and mode field measurements
Verification date: 2026-10-24
View original public information →Two-dimensional registration of microscopic field of view and laser spot
Please describe the task object, original picture or video, target indicators, device platform, interface and sample situation.
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