This direction breaks down and explains specific products, measurement tasks, imaging inputs, algorithm routes, proposed outputs, and acceptance methods, which can be used to evaluate samples and system conditions before the establishment of corporate projects.
Industry scope:Structured light and diffraction devices.
Involves measuring routes:Diffraction order position inversion, separated light spot array comparison, two-dimensional command/target surface coordinate calibration.
Standard diffraction grating·Diffraction order position inversion
Diffraction point angle and period candidates
Special development:The measurement/control core needs to be supplemented and verified according to the special project approval
View inputs, outputs, gaps and validation methods →Grating turntable·Diffraction order position inversion
Angle corresponding point trajectory
Special development:The measurement/control core needs to be supplemented and verified according to the special project approval
View inputs, outputs, gaps and validation methods →Laser wavelength teaching instrument·Diffraction order position inversion
Diffraction point distance and wavelength candidates
Special development:The measurement/control core needs to be supplemented and verified according to the special project approval
View inputs, outputs, gaps and validation methods →Periodic microstructure specimen·Diffraction order position inversion
Grade spacing changes
Special development:The measurement/control core needs to be supplemented and verified according to the special project approval
View inputs, outputs, gaps and validation methods →Acousto-optical device test bench·Separated light spot array comparison
First-level point trajectory and relative energy
General extensions:Verification needs to be completed according to the listed optical conditions, calibration and samples.
View inputs, outputs, gaps and validation methods →Multi-order diffraction beam splitter · separated light spot array comparison
Positive and negative order deviation
General extensions:Verification needs to be completed according to the listed optical conditions, calibration and samples.
View inputs, outputs, gaps and validation methods →Microhole array test piece · Two-dimensional command/target surface coordinate calibration
Array angle and alignment residual
General extensions:Verification needs to be completed according to the listed optical conditions, calibration and samples.
View inputs, outputs, gaps and validation methods →Diffraction projection component·Separated light spot array comparison
Point distance and temperature curve
General extensions:Verification needs to be completed according to the listed optical conditions, calibration and samples.
View inputs, outputs, gaps and validation methods →Grating diffraction and periodic structure: 8 potential application scenarios of laser spot and light point algorithms
Please describe the task object, original picture or video, target indicators, device platform, interface and sample situation.
Phone: 13910119357