Holo/Or multi-point diffraction beam splitter
Laser lattice, diffraction orders, spot spacing and optical configuration
Verification date: 2026-10-24
View original public information →Facing the microhole array test piece, the two-dimensional command/target surface coordinate calibration is used as the observation route, and the array angle and alignment residual are intended to be output. The page is for project evaluation and does not mean that the development has been completed or has been accepted on site.
Cover the calibrated corresponding points and independent set-out points of the two-dimensional field of view, and fix the optical path and working plane. Monochromatic light, far-field/Fourier surface imaging and incident angle reference
Calibration corresponding points and independent set-out points covering the two-dimensional field of view, fixed optical path and working plane
Existing algorithmic evidence:A101–A112 only complete analytical synthesis spot and controlled geometry verification; see laser_spot_benchmark.json
The light point detection front-end or timing statistics module can be reused, but the project still needs to add geometric calibration, time synchronization, motion compensation or equipment system integration.
Gaps in this scenario:Calibration acquisition, coordinate definition and verification are required; two-dimensional empirical mapping does not represent any three-dimensional or robot calibration. The hole size needs to be calculated separately by the diffraction model. Only the secondary position front-end is available, and the physical inversion core needs to be developed.
Route-level gaps:Calibration acquisition, coordinate definition and verification are required; two-dimensional empirical mapping does not represent any three-dimensional or robot calibration
"Partially reusable" only describes the relative development volume and does not constitute a commitment to accuracy, tempo, stability or delivery time.
Separate calibration points and set-out points to check edge, back-and-forth, temperature and repeated clamping errors. Standard grating, wavelength meter and angle table cross test
| Acceptance items | Evidence required for project confirmation | Current status |
|---|---|---|
| Inputs and samples | Real device original frames, normal/abnormal samples, exposure and light path conditions, sample grouping and set aside | Not provided, waiting for project input |
| Magnitude and Error | Independent reference value, calibration record, error statistical caliber and mutual confirmation threshold | Not verified |
| Exceptions and boundaries | Anticipated handling of missed detections, false detections, overexposure, occlusion, reflection, out-of-view and communication abnormalities | To be defined |
| System integration | Interface, time synchronization, deployment platform, tempo, log, version and continuous running record | Not integrated |
The source supports measurement principles or similar applications; the module combination, device and acceptance method in this scenario are engineering derivation, and product verification has not been completed.
Laser lattice, diffraction orders, spot spacing and optical configuration
Verification date: 2026-10-24
View original public information →Relationship between diffraction order, angle, wavelength and grating period
Verification date: 2026-10-24
View original public information →Installation rotation inspection of far-field spot array
Please describe the task object, original picture or video, target indicators, device platform, interface and sample situation.
Phone: 13910119357