Holo/Or multi-point diffraction beam splitter
Laser lattice, diffraction orders, spot spacing and optical configuration
Verification date: 2026-10-24
View original public information →LSP276 · Grating diffraction and periodic structure · Structured light and diffractive devices
Need to add new core
Study on the change of diffraction point distance after the sample is stretched
Facing the periodic microstructure specimen, the diffraction order position inversion is used as the observation route, and the order spacing changes are intended to be output. The page is for project evaluation and does not mean that the development has been completed or has been accepted on site.
Project Judgment Summary
Product/DevicePeriodic Microstructure Test Piece
Measure routeDIFFRACT·Diffraction order position inversion
Ability GradingNeed to add new core
Verification statusThe actual machine/product domain acceptance of this scenario has not been carried out
Scene nature:Similar potential application scenarios for laser spots. The potential application scenario has not yet been developed into a complete product system; the actual machine/product domain acceptance of this scenario has not been carried out. The actual product/product domain acceptance quantity in catalog statistics is 0.
Business tasks and intended output
- target audience
- Periodic microstructure specimen: diffraction order position inversion
- pseudo output
- Grade spacing changes
- Applicable conditions
- Strain inversion requires period and attitude compensation
- priority
- Special development. The measurement/control core needs to be supplemented and verified according to the special project approval
Imaging input and algorithm routing
Imaging and device conditions
A far-field device in which one of the wavelengths or periods, the diffraction order, and the direction of incidence are known. Monochromatic light, far-field/Fourier surface imaging and incident angle reference
DIFFRACT·Diffraction order position inversion
A far-field device in which one of the wavelengths or periods, the diffraction order, and the direction of incidence are known
- A102Multi-laser spot connected domain candidate extraction
- A103Logarithmic quadratic surface sub-pixel spot center
- A108One-to-one matching of multi-laser spot reference bits
- A111laser spot pixel to camera view angle conversion
Existing algorithmic evidence:A101–A112 only complete analytical synthesis spot and controlled geometry verification; see laser_spot_benchmark.json
Current capabilities and capabilities to be supplemented
Need to add new core
Need to add core computing
Light point extraction can only be used as an observation front-end, and core capabilities such as three-dimensional reconstruction, closed-loop control, wavefront or physical quantity inversion need to be developed and verified separately.
Gaps in this scenario:It is necessary to add grating equation/diffraction model, order identification and wavelength temperature drift compensation. Strain inversion requires period and attitude compensation. Only the secondary position front-end is available, and the physical inversion core needs to be developed.
Route-level gaps:Need to add grating equation/diffraction model, order identification and wavelength temperature drift compensation
"New cores required" only describes the relative development volume and does not constitute a commitment to accuracy, tempo, stability or delivery time.
Verification methods and acceptance prerequisites
Cross-test with standard grating and independent wavelength/angle reference to troubleshoot order ambiguities. Standard grating, wavelength meter and angle table cross test
| Acceptance items | Evidence required for project confirmation | Current status |
|---|---|---|
| Inputs and samples | Real device original frames, normal/abnormal samples, exposure and light path conditions, sample grouping and set aside | Not provided, waiting for project input |
| Magnitude and Error | Independent reference value, calibration record, error statistical caliber and mutual confirmation threshold | Not verified |
| Exceptions and boundaries | Anticipated handling of missed detections, false detections, overexposure, occlusion, reflection, out-of-view and communication abnormalities | To be defined |
| System integration | Interface, time synchronization, deployment platform, tempo, log, version and continuous running record | Not integrated |
Evidence sources and citation boundaries
The source supports measurement principles or similar applications; the module combination, device and acceptance method in this scenario are engineering derivation, and product verification has not been completed.
Newport grating diffraction principle
Relationship between diffraction order, angle, wavelength and grating period
Verification date: 2026-10-24
View original public information →Source usage scope:The public information is used to support the measurement principle or the existence of similar applications, and does not prove that this scenario has been developed, deployed or accepted by Jishi Technology.
Project consultation
xuzhiyang0928@gmail.com
Define the Development Scope with Samples and Device Requirements
Study on the change of diffraction point distance after the sample is stretched
Please describe the task object, original picture or video, target indicators, device platform, interface and sample situation.
Phone: 13910119357xuzhiyang0928@gmail.com