Ophir VCSEL measurements
VCSEL emission array and beam morphology measurement categories
Verification date: 2026-10-24
View original public information →LSP028 · VCSEL and emission array · Semiconductor wafer and packaging
Partially reusable
Registration Candidate Check of Microlenses and Emissive Arrays
Facing the VCSEL lens array, using the separation light point array comparison as the observation route, it is planned to output a list of registration offsets and abnormal points. The page is for project evaluation and does not mean that the development has been completed or has been accepted on site.
Project Judgment Summary
Product/DeviceVCSEL lens array
Measure routeARRAY·Separate spot array comparison
Ability GradingPartially reusable
Verification statusThe actual machine/product domain acceptance of this scenario has not been carried out
Scene nature:Similar potential application scenarios for laser spots. The potential application scenario has not yet been developed into a complete product system; the actual machine/product domain acceptance of this scenario has not been carried out. The actual product/product domain acceptance quantity in catalog statistics is 0.
Business tasks and intended output
- target audience
- VCSEL lens array: separation light spot array comparison
- pseudo output
- List of registration offsets and outliers
- Applicable conditions
- Need to know the layout and relay magnification
- priority
- General extension. Verification needs to be completed according to the listed optical conditions, calibration and samples.
Imaging input and algorithm routing
Imaging and device conditions
Separate and numberable multiple light spots, fixed receiving plane and field of view. Near-infrared response detector, synchronized triggering and separable near/far field point imaging
ARRAY·Separate spot array comparison
Separate and numberable multiple light spots, fixed receiving plane and field of view
- A102Multi-laser spot connected domain candidate extraction
- A105Laser spot second moment and main axis diameter
- A107Laser spot quality and usability diagnostics
- A108One-to-one matching of multi-laser spot reference bits
- A112Laser spot two-dimensional repeatability and coverage ellipse
Existing algorithmic evidence:A101–A112 only complete analytical synthesis spot and controlled geometry verification; see laser_spot_benchmark.json
Current capabilities and capabilities to be supplemented
Partially reusable
Requires calibration, synchronization or integration
The light point detection front-end or timing statistics module can be reused, but the project still needs to add geometric calibration, time synchronization, motion compensation or equipment system integration.
Gaps in this scenario:Point sequence numbering, local ROI, crosstalk and occlusion processing are required; A108 only matches by distance in the same coordinate system. The layout and relay magnification need to be known. The number of light points and the number of physical emission units do not have to correspond one to one.
Route-level gaps:Point sequence numbering, local ROI, crosstalk and occlusion processing are required; A108 only matches by distance in the same coordinate system
"Partially reusable" only describes the relative development volume and does not constitute a commitment to accuracy, tempo, stability or delivery time.
Verification methods and acceptance prerequisites
Verify point counts, match rates, and mismatches using known lattice and artificial defect/overlap/scrambling data. Cross-check with micrographs, independent radiometers and design arrays
| Acceptance items | Evidence required for project confirmation | Current status |
|---|---|---|
| Inputs and samples | Real device original frames, normal/abnormal samples, exposure and light path conditions, sample grouping and set aside | Not provided, waiting for project input |
| Magnitude and Error | Independent reference value, calibration record, error statistical caliber and mutual confirmation threshold | Not verified |
| Exceptions and boundaries | Anticipated handling of missed detections, false detections, overexposure, occlusion, reflection, out-of-view and communication abnormalities | To be defined |
| System integration | Interface, time synchronization, deployment platform, tempo, log, version and continuous running record | Not integrated |
Evidence sources and citation boundaries
The source supports measurement principles or similar applications; the module combination, device and acceptance method in this scenario are engineering derivation, and product verification has not been completed.
Ophir wide angle divergent beam
Imaging conditions for far-field acquisition and wide-angle beam
Verification date: 2026-10-24
View original public information →Source usage scope:The public information is used to support the measurement principle or the existence of similar applications, and does not prove that this scenario has been developed, deployed or accepted by Jishi Technology.
Project consultation
xuzhiyang0928@gmail.com
Define the Development Scope with Samples and Device Requirements
Registration Candidate Check of Microlenses and Emissive Arrays
Please describe the task object, original picture or video, target indicators, device platform, interface and sample situation.
Phone: 13910119357xuzhiyang0928@gmail.com