Ophir VCSEL measurements
VCSEL emission array and beam morphology measurement categories
Verification date: 2026-10-24
View original public information →LSP027 · VCSEL and emission array · Semiconductor wafer and packaging
Reusable modules
Comparison of spot axis ratio of each emission zone
Facing the VCSEL far-field component, the spot shape and relative distribution are used as the observation route, and the partition width and shape distribution are planned to be output. The page is for project evaluation and does not mean that the development has been completed or has been accepted on site.
Project Judgment Summary
Product/DeviceVCSEL far field components
Measure routeBM · Spot shape and relative distribution
Ability GradingReusable modules
Verification statusThe actual machine/product domain acceptance of this scenario has not been carried out
Scene nature:Similar potential application scenarios for laser spots. The potential application scenario has not yet been developed into a complete product system; the actual machine/product domain acceptance of this scenario has not been carried out. The actual product/product domain acceptance quantity in catalog statistics is 0.
Business tasks and intended output
- target audience
- VCSEL far-field components: spot shape and relative distribution
- pseudo output
- Zone width and morphological distribution
- Applicable conditions
- Wide-angle projection models require special calibration
- priority
- General extension. Verification needs to be completed according to the listed optical conditions, calibration and samples.
Imaging input and algorithm routing
Imaging and device conditions
Linear response imaging, fixed attenuation and background acquisition avoid saturation and ROI truncation. Near-infrared response detector, synchronized triggering and separable near/far field point imaging
BM · Spot shape and relative distribution
Linear response imaging, fixed attenuation and background acquisition to avoid saturation and ROI truncation
- A101Adaptive threshold laser spot grayscale centroid
- A105Laser spot second moment and main axis diameter
- A106Laser spot surrounding energy diameter
- A107Laser spot quality and usability diagnostics
Existing algorithmic evidence:A101–A112 only complete analytical synthesis spot and controlled geometry verification; see laser_spot_benchmark.json
Current capabilities and capabilities to be supplemented
Reusable modules
Existing modules can be used as hosts
Existing light point positioning, quality diagnosis or statistical modules can be used as the main calculation basis; ROI, calibration, threshold and interface verification still need to be completed by device.
Gaps in this scenario:Pixel scale, background subtraction and dynamic range verification required; grayscale integration is not watts or joules. Wide-angle projection models require special calibration. The number of light points and the number of physical emission units do not have to correspond one to one.
Route-level gaps:Pixel scale, background subtraction and dynamic range verification required; grayscale integration not watts or joules
"Reusable modules" only describe the relative development volume and do not constitute a commitment to accuracy, tempo, stability or delivery time.
Verification methods and acceptance prerequisites
Verify center, width and cutoff separately against a stand-alone beam analyzer or known spot pattern. Cross-check with micrographs, independent radiometers and design arrays
| Acceptance items | Evidence required for project confirmation | Current status |
|---|---|---|
| Inputs and samples | Real device original frames, normal/abnormal samples, exposure and light path conditions, sample grouping and set aside | Not provided, waiting for project input |
| Magnitude and Error | Independent reference value, calibration record, error statistical caliber and mutual confirmation threshold | Not verified |
| Exceptions and boundaries | Anticipated handling of missed detections, false detections, overexposure, occlusion, reflection, out-of-view and communication abnormalities | To be defined |
| System integration | Interface, time synchronization, deployment platform, tempo, log, version and continuous running record | Not integrated |
Evidence sources and citation boundaries
The source supports measurement principles or similar applications; the module combination, device and acceptance method in this scenario are engineering derivation, and product verification has not been completed.
Ophir wide angle divergent beam
Imaging conditions for far-field acquisition and wide-angle beam
Verification date: 2026-10-24
View original public information →Source usage scope:The public information is used to support the measurement principle or the existence of similar applications, and does not prove that this scenario has been developed, deployed or accepted by Jishi Technology.
Project consultation
xuzhiyang0928@gmail.com
Define the Development Scope with Samples and Device Requirements
Comparison of spot axis ratio of each emission zone
Please describe the task object, original picture or video, target indicators, device platform, interface and sample situation.
Phone: 13910119357xuzhiyang0928@gmail.com