IBM Photothermal Deflectometry Research
The principle of probe beam deflection caused by refractive index gradient
Verification date: 2026-10-24
View original public information →Facing the catalytic carrier sample, the deflection of the photothermal probe is used as the observation route, and the probe deflection time series is intended to be output. The page is for project evaluation and does not mean that the development has been completed or has been accepted on site.
The pump/probe optical path, modulation reference and thermal boundaries are known, and the samples cover the modulation frequency. Pump/probe optical path, synchronized modulation and controlled temperature environment
The pump/probe optical path, modulation reference and thermal boundaries are known, and the sampling covers the modulation frequency
Existing algorithmic evidence:A101–A112 only complete analytical synthesis spot and controlled geometry verification; see laser_spot_benchmark.json
Light point extraction can only be used as an observation front-end, and core capabilities such as three-dimensional reconstruction, closed-loop control, wavefront or physical quantity inversion need to be developed and verified separately.
Gaps in this scenario:New phase locking/thermal diffusion/refraction models and physical property parameter inversion need to be added; image deflection does not directly give thermal conductivity or absorptivity. Reaction rates and concentrations require independent chemical analysis. All physical property outputs are inversions to be developed and are not directly replaced by displacements.
Route-level gaps:New phase locking/thermal diffusion/refraction models and physical property parameter inversion need to be added; image deflection does not directly provide thermal conductivity or absorptivity
"New cores required" only describes the relative development volume and does not constitute a commitment to accuracy, tempo, stability or delivery time.
Verify the inversion using reference materials and independent thermal analyzers, varying frequency, beam offset, and boundary conditions. Reference materials, blank samples and independent physical property instrument comparison
| Acceptance items | Evidence required for project confirmation | Current status |
|---|---|---|
| Inputs and samples | Real device original frames, normal/abnormal samples, exposure and light path conditions, sample grouping and set aside | Not provided, waiting for project input |
| Magnitude and Error | Independent reference value, calibration record, error statistical caliber and mutual confirmation threshold | Not verified |
| Exceptions and boundaries | Anticipated handling of missed detections, false detections, overexposure, occlusion, reflection, out-of-view and communication abnormalities | To be defined |
| System integration | Interface, time synchronization, deployment platform, tempo, log, version and continuous running record | Not integrated |
The source supports measurement principles or similar applications; the module combination, device and acceptance method in this scenario are engineering derivation, and product verification has not been completed.
The principle of probe beam deflection caused by refractive index gradient
Verification date: 2026-10-24
View original public information →Displacement measurements and thermal gradient effects in specific fire tests, without extrapolation of values
Verification date: 2026-10-24
View original public information →Effect of speckle on position and distance uncertainty
Verification date: 2026-10-24
View original public information →Observation of beam deflection caused by thermal flow disturbance
Please describe the task object, original picture or video, target indicators, device platform, interface and sample situation.
Phone: 13910119357