How Nanosurf AFM works
Reflected light spot, cantilever beam deflection and sensitivity calibration
Verification date: 2026-10-24
View original public information →Facing the microlens actuator, taking the spot shape and relative distribution as the observation route, the driving amount and spot shape are intended to be output. The page is for project evaluation and does not mean that the development has been completed or has been accepted on site.
Linear response imaging, fixed attenuation and background acquisition avoid saturation and ROI truncation. Microscopic focusing of incident light, reflection reception and independently driven reference
Linear response imaging, fixed attenuation and background acquisition to avoid saturation and ROI truncation
Existing algorithmic evidence:A101–A112 only complete analytical synthesis spot and controlled geometry verification; see laser_spot_benchmark.json
Existing light point positioning, quality diagnosis or statistical modules can be used as the main calculation basis; ROI, calibration, threshold and interface verification still need to be completed by device.
Gaps in this scenario:Pixel scale, background subtraction and dynamic range verification required; grayscale integration is not watts or joules. The solution of focal length and focal length requires an imaging model. The camera only covers the frequency bands supported by its sampling and exposure
Route-level gaps:Pixel scale, background subtraction and dynamic range verification required; grayscale integration not watts or joules
"Reusable modules" only describe the relative development volume and do not constitute a commitment to accuracy, tempo, stability or delivery time.
Verify center, width and cutoff separately against a stand-alone beam analyzer or known spot pattern. Independent angle/displacement meter and drive sweep comparison
| Acceptance items | Evidence required for project confirmation | Current status |
|---|---|---|
| Inputs and samples | Real device original frames, normal/abnormal samples, exposure and light path conditions, sample grouping and set aside | Not provided, waiting for project input |
| Magnitude and Error | Independent reference value, calibration record, error statistical caliber and mutual confirmation threshold | Not verified |
| Exceptions and boundaries | Anticipated handling of missed detections, false detections, overexposure, occlusion, reflection, out-of-view and communication abnormalities | To be defined |
| System integration | Interface, time synchronization, deployment platform, tempo, log, version and continuous running record | Not integrated |
The source supports measurement principles or similar applications; the module combination, device and acceptance method in this scenario are engineering derivation, and product verification has not been completed.
Reflected light spot, cantilever beam deflection and sensitivity calibration
Verification date: 2026-10-24
View original public information →System principles of position drift, pointing drift and active compensation
Verification date: 2026-10-24
View original public information →Focusing stroke corresponds to changes in focal spot
Please describe the task object, original picture or video, target indicators, device platform, interface and sample situation.
Phone: 13910119357