Duma Beam Position and Optical Adjustment Application
Application categories for beam position, optical setup and spot shape
Verification date: 2026-10-24
View original public information →For the semiconductor laser module, the light spot timing and drift are used as the observation route, and the output beam center trajectory and stable waiting time are planned. The page is for project evaluation and does not mean that the development has been completed or has been accepted on site.
Global shutter or known readout timing, saves timestamps, and exposures adapted to frequency of motion. Wavelength-adapted cameras, attenuators and fixed near/far field fixtures
Global shutter or known readout timing, saves timestamps, exposures fit to frequency of motion
Existing algorithmic evidence:A101–A112 only complete analytical synthesis spot and controlled geometry verification; see laser_spot_benchmark.json
The light point detection front-end or timing statistics module can be reused, but the project still needs to add geometric calibration, time synchronization, motion compensation or equipment system integration.
Gaps in this scenario:Requires sampling rate/exposure verification, time synchronization and reference target camera motion compensation; not a substitute for laser Doppler vibrometers. Synchronous current and case temperature. Pixel grayscale and optical power are calibrated separately
Route-level gaps:Requires sampling rate/exposure verification, time synchronization and reference target camera motion compensation; not a substitute for laser Doppler vibrometers
"Partially reusable" only describes the relative development volume and does not constitute a commitment to accuracy, tempo, stability or delivery time.
Verify aliasing, phase, drift and frame loss with a known frequency shaker or encoder comparison. Independent beam analyzer and temperature control/current recording cross-reference
| Acceptance items | Evidence required for project confirmation | Current status |
|---|---|---|
| Inputs and samples | Real device original frames, normal/abnormal samples, exposure and light path conditions, sample grouping and set aside | Not provided, waiting for project input |
| Magnitude and Error | Independent reference value, calibration record, error statistical caliber and mutual confirmation threshold | Not verified |
| Exceptions and boundaries | Anticipated handling of missed detections, false detections, overexposure, occlusion, reflection, out-of-view and communication abnormalities | To be defined |
| System integration | Interface, time synchronization, deployment platform, tempo, log, version and continuous running record | Not integrated |
The source supports measurement principles or similar applications; the module combination, device and acceptance method in this scenario are engineering derivation, and product verification has not been completed.
Application categories for beam position, optical setup and spot shape
Verification date: 2026-10-24
View original public information →Camera beam profile analysis and industrial laser diagnosis; power measurement requires special sensors
Verification date: 2026-10-24
View original public information →Relationship between source size, focal length and divergence angle
Verification date: 2026-10-24
View original public information →Recording of electrical and thermal drift on laser module
Please describe the task object, original picture or video, target indicators, device platform, interface and sample situation.
Phone: 13910119357