Service scope and implementation plan
direction numberD16
Demand scenario8 items
main inputSWIR L1/L5;
Typical routeT12、T03、T04、T10、T18、T11、T05、T01
The project scope is determined based on samples, equipment, working conditions and written indicators; general modules, special models and multi-sensor integration are configured according to the evaluation results.
Application scenarios and development content
IR121SWIR Imaging of internal cracks and edge defects in silicon wafers
- Minimum input and technical route
- SWIR L1/L5；T12
- target output
- Cracks, chipping and transmission anomalies
- Implementation
- Requires specialized optics
- critical acceptance
- Minimum crack compared to microscopic/acoustic true value
IR122Wafer hot spots and local leakage thermal localization
- Minimum input and technical route
- MWIR/LWIR Macro L2/L3;T03+T04
- target output
- Hot spots, coordinates and electrical excitation correlation
- Implementation
- Requires macro radiation calibration
- critical acceptance
- Compare with electrical measurement/failure analysis, positioning error
IR123Lock-in thermography locates chip short circuits and leaks
- Minimum input and technical route
- L5；T10
- target output
- Phase hot spots and fault locations
- Implementation
- Requires electrical stimulation tooling
- critical acceptance
- Versus probe/open true value, POD
IR124Photoluminescence PL/Electroluminescence EL Uniformity
- Minimum input and technical route
- NIR/SWIR L1/L5；T18
- target output
- Luminous intensity, dark areas and uniformity
- Implementation
- Need special implementation
- critical acceptance
- Compared with electrical performance/reference sheet, repeatability
IR125VCSEL/IR LED array lighting and power uniformity
- Minimum input and technical route
- NIR/SWIR L1；T11
- target output
- Luminous Points, Disadvantages, Relative Intensities and Arrangements
- Implementation
- Reusable A43/A44
- critical acceptance
- Versus power meter/probe station, point level Recall
IR126OLED/MicroLED driver thermal anomalies and aging hot spots
- Minimum input and technical route
- LWIR/MWIR L2/L3；T03+T05
- target output
- Pixel/area thermal anomalies and aging trends
- Implementation
- Requires high-resolution optics
- critical acceptance
- Minimum divisible area, correlation with life data
IR127Active thermal detection of semiconductor package voids and delamination
- Minimum input and technical route
- L5；T10
- target output
- Defect candidate, area and depth proxies
- Implementation
- Need reference sample
- critical acceptance
- Versus X-ray/CT/SAM, POD
IR128Optical filters, windows and detector response uniformity
- Minimum input and technical route
- Blackbody/Light Source L5;T01+T03
- target output
- Response plots, bad elements and band consistency
- Implementation
- Instrument calibration required
- critical acceptance
- Uniform source repeatability, response residuals
Implementation and delivery methods
- Project input confirmationCheck camera, spectral band, bit depth, SDK, environmental conditions, sample and acceptance true value.
- Sample verificationVerify key processing links, applicable conditions and abnormal working conditions, and determine the development scope and acceptance methods.
- Algorithm development and integrationImplement data parsing, algorithms, quality gating, interfaces and target platform deployment.
- Test acceptance and handoverRetest according to the agreed test set and target platform, and hand over the deliverables, test results and applicable conditions.
- Requirements and technical solutions, input and output and interface field definitions
- Algorithm library, model or SDK/API; delivery form is confirmed in the project plan
- Sample program, parameter configuration, error status and calling instructions
- Test set version, indicator definition, stratification results and failed sample records
- Target platform adaptation, resource usage and running delay records
- Version, dependencies, license, reproduction steps and applicable conditions description
Acceptance design
Each scenario establishes independent test cases according to "key acceptance". When sharing models across scenarios, results are reported separately for each scenario, distance, load, environment, and target size, supplemented by overall statistics.
When high-risk alarms or controls are involved, the algorithm output is used for review or linkage judgment; safety functions, regulatory responsibilities, and automatic disposal require separate design and acceptance.
Frequently Asked Questions for Enterprise Customers
Can I purchase directly based on one of the scenes?
Can be evaluated first as a separate work package. The formal scope should describe the device, data, target objects, environment, interfaces, delivery form, and acceptance thresholds.
Can it be started when there are no abnormal samples?
The data interface, normal baseline, acquisition plan and simulation/controlled test design can be completed first; the abnormal detection rate and fault classification effect can be evaluated after obtaining sufficient abnormal true values.
Can the algorithm directly trigger alarms or equipment actions?
Duration, deduplication, quality gating, manual review, communication failure and safety interlocking need to be designed based on business risks. High-risk actions should be activated after completion of independent safety mechanisms and on-site acceptance.