Industry Application Solution · CASE-02Application plan, no customer on-site acceptance record has been formed

VCSEL and DOE lattice shortcomings and position deviation detection application solutions

For separable VCSEL, DOE and multi-channel light emission patterns, this solution puts the number of points, point distance, registration and image quality in the same inspection to avoid judging the emission status solely based on the presence of light or total brightness.

Illustration of the processing chain from camera input to algorithm, calibration, business output and sub-item acceptance of laser points, dot matrix and laser lines
Processing chain diagram. The actual optical path, calibration, interface, output and acceptance indicators are confirmed by project.

Project Judgment Summary

Page natureEnterprise application plan, no customer on-site acceptance record has been formed
imaging inputlaser dot matrix
main outputMissing points, extra points, point deviations, array matching status and abnormality diagrams
Prerequisites for implementationBitmap original image, reference template, exposure settings, occlusion and defect samples
Current status:Application plan, no customer on-site acceptance record has been formed

Tasks and image input

Weaknesses, shortcomings, redundant points and array misalignment will produce different results, and point sequence mismatches may also mask true deviations.

Input data: reference lattice, normal and abnormal original frames, expected number of points/point pitch, and necessary time-sharing drive, exposure and trigger information.

Algorithm processing and output

Candidate point extraction → local validity check → reference point sequence correspondence → defect/extra points, point distance and registration residual calculation.

Output results: point-by-point coordinates, missing/extra numbers, point-to-point deviations, and mismatch lists; relative grayscale separate from geometric results.

Implementation and verification

Form the reference template, point sequence rules, abnormal formula and result interface of the limited model; the pulse array needs to be separately tested synchronously.

Verification method: Isolate test sets by sample/batch, count missing points, mismatched points, mismatches and position errors by category, and add weakness, saturation, occlusion and scrambled data.

Applicable boundaries and existing basis

Dense overlap and coherent crosstalk cannot apply the separation point method by default; missing points are not necessarily transmitter failures, and grayscale differences are not equal to absolute power differences.

The existing multi-point extraction and distance matching are the basis for calculation, and there is no acceptance data for real array crosstalk and product detection rate.

Corresponding algorithm:Laser dot matrix detection and two-dimensional calibration algorithm;Laser spot positioning and beam profile analysis algorithm。

Enterprise project promotion and acceptance

  1. scope confirmationClarify the objects, workstations, inputs, outputs, units, interfaces and abnormal conditions that must be covered.
  2. Sample verificationUse representative normal and abnormal samples to establish a baseline and record what works, what fails, and data gaps.
  3. Development joint debuggingComplete the algorithm, calibration, interface and equipment adaptation according to the approved scope, and retain the version, parameters and abnormal status.
  4. Item acceptanceUse independent samples and reference value retests to confirm errors, detection, tempo, stability and deliverables respectively.
Project consultation

Define the Development Scope with Samples and Device Requirements

VCSEL and DOE lattice shortcomings and position deviation detection application solutions

Please describe the task object, original picture or video, target indicators, device platform, interface and sample situation.

Phone: 13910119357
xuzhiyang0928@gmail.com

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