VCSEL and DOE lattice shortcomings and position deviation detection application solutions
For separable VCSEL, DOE and multi-channel light emission patterns, this solution puts the number of points, point distance, registration and image quality in the same inspection to avoid judging the emission status solely based on the presence of light or total brightness.
Project Judgment Summary
Tasks and image input
Weaknesses, shortcomings, redundant points and array misalignment will produce different results, and point sequence mismatches may also mask true deviations.
Input data: reference lattice, normal and abnormal original frames, expected number of points/point pitch, and necessary time-sharing drive, exposure and trigger information.
Algorithm processing and output
Candidate point extraction → local validity check → reference point sequence correspondence → defect/extra points, point distance and registration residual calculation.
Output results: point-by-point coordinates, missing/extra numbers, point-to-point deviations, and mismatch lists; relative grayscale separate from geometric results.
Implementation and verification
Form the reference template, point sequence rules, abnormal formula and result interface of the limited model; the pulse array needs to be separately tested synchronously.
Verification method: Isolate test sets by sample/batch, count missing points, mismatched points, mismatches and position errors by category, and add weakness, saturation, occlusion and scrambled data.
Applicable boundaries and existing basis
Dense overlap and coherent crosstalk cannot apply the separation point method by default; missing points are not necessarily transmitter failures, and grayscale differences are not equal to absolute power differences.
The existing multi-point extraction and distance matching are the basis for calculation, and there is no acceptance data for real array crosstalk and product detection rate.
Corresponding algorithm:Laser dot matrix detection and two-dimensional calibration algorithm;Laser spot positioning and beam profile analysis algorithm。
Enterprise project promotion and acceptance
- scope confirmationClarify the objects, workstations, inputs, outputs, units, interfaces and abnormal conditions that must be covered.
- Sample verificationUse representative normal and abnormal samples to establish a baseline and record what works, what fails, and data gaps.
- Development joint debuggingComplete the algorithm, calibration, interface and equipment adaptation according to the approved scope, and retain the version, parameters and abnormal status.
- Item acceptanceUse independent samples and reference value retests to confirm errors, detection, tempo, stability and deliverables respectively.
Define the Development Scope with Samples and Device Requirements
VCSEL and DOE lattice shortcomings and position deviation detection application solutions
Please describe the task object, original picture or video, target indicators, device platform, interface and sample situation.
Phone: 13910119357xuzhiyang0928@gmail.com