Infrared image algorithm development and equipment adaptation

Active thermal imaging and thermal non-destructive testing infrared algorithm development services

Covering a total of 20 algorithms or engineering workflows from I101 to I120, it provides needs assessment, special implementation, SDK/API, platform adaptation and test acceptance for enterprise projects.

Submit project information · Get evaluation Return to all algorithm catalogs

Classification scope and enterprise project entrance

Algorithm numberI101–I120

Service content20 algorithmic or engineering workflows

Main contentThermal response curve extraction and baseline subtraction, heating and cooling rates and time constants, pulse thermography raw thermal contrast, normalized/differential absolute thermal contrast

Delivery methodPhased evaluation, algorithm/model, SDK/API, deployment and test records

Specific algorithm development services

Thermal response curve extraction and baseline subtraction

Input: L5 time series

Output: pixels/ROI response curve

Universal foundation can be reused, requiring infrared adaptation

View service details →I102

Heating and cooling rates and time constants

Input: Thermal excitation sequence

Output: Rate, time constant and distribution plot

Universal foundation can be reused, requiring infrared adaptation

View service details →I103

Pulse Thermography Raw Thermal Contrast

Input: flash excitation sequence

Output: Absolute/differential thermal comparison plot

Requires project-specific development and validation

View service details →I104

Normalized/differential absolute thermal comparison

Input: test piece and reference area sequence

Output: comparison curve and defect candidates

Requires project-specific development and validation

View service details →I105

TSR log polynomial reconstruction

Input: Pulse Thermal Sequence

Output: Reconstructed temperature and coefficient map

Requires project-specific development and validation

View service details →I106

TSR first/second logarithmic derivative

Input: TSR coefficient

Output: Derivative map and defect enhancement map

Requires project-specific development and validation

View service details →I107

Pulse phase thermography PPT

Input: hot sequence

Output: frequency-amplitude-phase diagram

Universal foundation can be reused, requiring infrared adaptation

View service details →I108

Lock-in thermography amplitude and phase

Input: Periodic excitation sequence

Output: Phase-locked amplitude and phase plots

Requires project-specific development and validation

View service details →I109

Multi-frequency phase locking and frequency scanning

Input: multi-frequency excitation

Output: Frequency response and depth sensitivity map

Requires project-specific development and validation

View service details →I110

Principal component thermography PCT

Input: hot sequence

Output: EOF/principal component defect map

Universal foundation can be reused, requiring infrared adaptation

View service details →I111

Independent Component Analysis and Sparse Thermal Image Decomposition

Input: hot sequence

Output: independent/sparse component map

Requires project-specific development and validation

View service details →I112

Dynamic thermal chromatography maxigram/timegram

Input: hot sequence

Output: Maximum contrast and arrival time plots

Requires project-specific development and validation

View service details →I113

Thermal Wave Propagation and Depth Depth Estimation

Input: phase/time characteristics, material parameters

Output: deep candidates and scope

Requires project-specific development and validation

View service details →I114

Thermal diffusivity and thermal conductivity inversion

Input: excitation, geometry, boundary parameters

Output: Property estimates and uncertainties

Requires project-specific development and validation

View service details →I115

Vibration thermography crack heat source extraction

Input: Vibration + Heat Sequence

Output: Crack heat source and response curve

Requires project-specific development and validation

View service details →I116

Induction Thermography Surface/Near Surface Crack Detection

Input: electromagnetic excitation + thermal sequence

Output: Crack candidates and phases

Requires project-specific development and validation

View service details →I117

Step heating and long pulse thermography

Input: Long-duration excitation sequence

Output: deep defect comparison

Requires project-specific development and validation

View service details →I118

laser spot/line scanning thermal imaging

Input: Scanning excitation + thermal sequence

Output: Local crack/defect map

Requires project-specific development and validation

View service details →I119

Defect segmentation, size and depth joint estimation

Input: processed heat map and true value

Output: defect mask, size, depth

Need to be evaluated according to project conditions

View service details →I120

POD, Reference Block, and Thermal NDT Uncertainties

Input: artificially defective test block/repeated test

Output: detection probability, a90/95 and other statistics

Requires project-specific development and validation

View service details →

Implementation and delivery methods

Project input confirmationCheck camera, spectral band, bit depth, SDK, environmental conditions, sample and acceptance true value.
Sample verificationVerify key processing links, applicable conditions and abnormal working conditions, and determine the development scope and acceptance methods.
Algorithm development and integrationImplement data parsing, algorithms, quality gating, interfaces and target platform deployment.
Test acceptance and handoverRetest according to the agreed test set and target platform, and hand over the deliverables, test results and applicable conditions.

Requirements and technical solutions, input and output and interface field definitions
Algorithm library, model or SDK/API; delivery form is confirmed in the project plan
Sample program, parameter configuration, error status and calling instructions
Test set version, indicator definition, stratification results and failed sample records
Target platform adaptation, resource usage and running delay records
Version, dependencies, license, reproduction steps and applicable conditions description

Acceptance and capability boundaries

Each algorithm sets accuracy, repeatability, robustness, speed, resource usage and failure status indicators according to the output type.

Production performance and delivery scope are confirmed based on target equipment, independent samples and written acceptance indicators.

Project consultation

Define the Development Scope with Samples and Device Requirements

Active thermal imaging and thermal non-destructive testing infrared algorithm development services

Please describe the task object, original picture or video, target indicators, device platform, interface and sample situation.

Phone: 13910119357
xuzhiyang0928@gmail.com