Candidate processing workflow
RGB-D/multiview capture → plane/instance segmentation → layer-height clustering → boxes and tilt
JIVISION offers project development and technical assessment for Pallet, Stack Pattern, Stack Height and Tilt Measurement. Scope: Pallet pattern completeness, layer count, lean, overheight and protrusions.
Pallet pattern completeness, layer count, lean, overheight and protrusions
Sample wrapping film, dark loads and hidden pallets; define lean relative to ground, not image axes.
These are candidate implementation paths. Establish a baseline on real samples, then select or combine methods for imaging, speed and deployment constraints. Model names do not imply measured project results.
RGB-D/multiview capture → plane/instance segmentation → layer-height clustering → boxes and tilt
Provide drawings/datums, range and tolerances, traceable references, surface materials, working distance, camera arrangement, calibration conditions and cycle time.
Pallet-pattern recognition, dimensions/heights and warehouse interface
Specify input formats, output fields, coordinates/units, error states, versions and invocation methods. Define review and failure handling. The statement of work determines the exact scope of source code, executables, model files or analysis reports.
Layer-count accuracy; height/tilt error; occlusion failure rate
Distinguish resolution, absolute error and repeatability. Compare independent references across the working range, record calibration residuals and environmental/pose changes, and assess the measurement system where required.
These are measures to agree and test, not achieved-performance claims. Freeze samples, reference truth, thresholds and hardware/software versions before acceptance; report subgroup results and failures, identifying under-sampled conditions as uncovered.
Agree targets, stations, inputs and responsibilities in a statement of work, separating required and excluded conditions.
Use representative samples to test critical risks, document feasibility/failures and scope the next-stage estimate.
Implement agreed functions and interfaces with configuration/change records; use offline replay before authorized device or site integration.
Retest against individual measures and hand over contracted artifacts with known limits; manage maintenance, expansion and changeovers as subsequent work packages.
Pixel resolution is not measurement accuracy. Include occlusion, reflections, vibration and thermal drift in the error budget; confirm statutory metrology obligations separately.
Candidate technologies are not license clearance. Check code, model weights, training data and dependency versions separately. Replace, license or exclude components unsuitable for the intended commercial delivery. Customer data is not used for public training by default.
Pallet pattern completeness, layer count, lean, overheight and protrusions. Deliverables: Pallet-pattern recognition, dimensions/heights and warehouse interface
Sample wrapping film, dark loads and hidden pallets; define lean relative to ground, not image axes.
Task-specific measures: Layer-count accuracy; height/tilt error; occlusion failure rate. Distinguish resolution, absolute error and repeatability. Compare independent references across the working range, record calibration residuals and environmental/pose changes, and assess the measurement system where required.
After reviewing samples for pallet pattern completeness, layer count, lean, overheight and protrusions, equipment conditions and interfaces, scope validation, development, deployment and acceptance separately. Data coverage, site changes and delivery rights affect the estimate; no fixed performance or schedule is promised before assessment.
Service ID: B12 · Pallet, Stack Pattern, Stack Height and Tilt Measurement
Describe available samples, equipment and target measures. Agree confidentiality and permissions before transferring sensitive or personal data through an approved channel.
+86 13910119357